Establishing Cryogenic Wafer-Level Characterization as a Foundational Methodology for Quantum Computing Technologies
Science for Systems, Band 71
Nikola David Komericki
Hrsg.: Fraunhofer IAF, Freiburg
2026, 217 S., num., mostly col. illus. and tab., Softcover
Sprache: Englisch
Freiburg, Univ., Diss., 2026
Fraunhofer Verlag
ISBN 978-3-8396-2223-0

Inhalt
Fault-tolerant quantum computing promises to revolutionize computational science by solving problems beyond the reach of classical systems. Achieving this goal requires combining quantum device physics, semiconductor fabrication, and statistical characterization under cryogenic conditions. In this context, wafer-level characterization is essential for assessing device functionality, reproducibility, and stability, and for advancing from proof-of-concept devices to manufacturable quantum hardware.

This dissertation establishes cryogenic wafer-level characterization at 1.6 K as a key methodology for evaluating and developing quantum-computing devices across multiple technologies and wafer sizes. The methods were applied to a Si/SiGe spin qubit platform on 200 mm wafers and to Nb/Al-AlOx/Nb transmon qubit technologies on 150 mm and 300 mm wafers, enabling wafer-level evaluation of quantum dot functionality and statistical assessment of transmon qubit uniformity.

Verfügbare Formate

Softcover
EUR 66.00 (* inkl. MwSt.)
erscheint ca. November 2026