Buch: Lock-in Thermography
Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
3., Aufl.
2019, xxi, 321  S., 58 SW-Abb., 68 Farbabb. 235 mm, Hardcover
Sprache: Englisch
Springer, Berlin
ISBN 978-3-319-99824-4

Inhalt
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

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